Veröffentlicht am 09. Oktober 2018.

EMEA Sector Systems Engineering Conference 2018

Datum: 5.-7. November 2018

Veranstaltungsort: Berlin: Mercure Hotel, Stephanstraße 41, 10559 Berlin, Germany

BTC Embedded Systems nimmt an der EMEA Sector Systems Engineering Conference 2018 in Berlin teil und ist im Programm an folgenden Vorträgen beteiligt:

Montag 5. November

WIILLERT Software Tools GmbH - FUNCTIONAL TEST – A severe and underestimated Systems Engineering Challenge
Joachim Engelhard, Wolfgang Leimbach (WILLERT)
Dr. Hartmut Wittke (BTC Embedded Systems)

Using Rhapsody Test Conductor we are going to show a very efficient way of developing Test Harnesses and Test Pattern in an early modelbased and automated fashion. You will be surprised, how smart we will reuse and further refine those during the different development phases. In real life this will of course be accomplished by different engineers from more than just one department - ideally not just by the Test Department. And so, quite naturally, this technique/methodology automatically establishes communication between the different Engineering Domains and therefore nicely supports one of the major ideas behind Systems Engineering.


Dienstag 6. November

Airbus Operations GmbH - Model-in-the-Loop Tests of Highly Configurable Systems
M. Sieber, Chr. Wachtendorf, T. Hör, A. Köll / BTC Embedded Systems
AG and Airbus Operations GmbH

The specification of complex and highly configurable systems makes an early validation during the specification necessary because late findings are extremely costly. For this reason a model-based specification approach (using the tool IBM Rational Rhapsody) in combination with Model-in-the-Loop (MiL) testing was applied. The configuration of the model was made possible by a methodology based on XSD and XML files.
MiL tests were managed and performed with the tool TestConductor , an add-on available for the modelling tool. High test coverage was reached by test case specific configurations of the model.
In future System-in-the-Loop (SiL) tests shall be supported by reuse of the MiL test cases during system testing.